2019 32th IEEE International Conference on Microelectronic Test Structures
2019-03-18
Primarius，Inc. will attend the 32th IEEE International Conference on Microelectronic Test Structures（ICMTS）from March 18 to 21 in Fukuoka, Japan.
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SPICE ModelBaseband Modeling
• BSIMProPlus
RF Modeling
• MeQLab
Model Extraction Automation
• SDEP
Model QA
• ME-Pro
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PDKPCell Development
• PCellLab
PDK Verification
• PQLab
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Standard CellLibrary Characterization
• NanoCell
Library Validation
• LibWiz
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FabricationLithography Modeling and Simulation
• FabLitho
Reticle Automated Design
• FAR
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Design EnvironmentSchematic Capture
• NanoDesigner SE
Layout Editor
• NanoDesigner LS
Interactive Physical Verification
• NanoDesigner iV
Design Optimization
• NanoDesigner Optimizer
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Circuit SimulationSPICE Simulator
• NanoSpice • NanoSpice X • NanoSpice Giga
FastSPICE Simulator
• NanoSpice Pro • NanoSpice Pro X
Mixed Signal
• NanoSpice MS
Waveform Analysis
• NanoWave
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Circuit Analysis
Static and Dynamic Circuit Check
• NanoSpice CCK
Yield Analysis
• NanoYield
Signal Integrity
• NanoSpice SI
Critical Path Analysis
• PathInspector
Power Device Design Verification
• PTM
Power Distribution Network Analysis
ESD Verification
• ESDi
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Circuit SimulationDigital Simulation
• VeriSim
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Standard Cell
Library Characterization
• NanoCell
Library Validation
• LibWiz
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Design & VerificationTiming Analysis
• TRASTA
Floor Planning
• NavisPro
Signal Integrity Analysis
• NanoSpice SI
Power Design Analysis
• PTM
ESD Verification
• ESDi
Chip-to-Package Connectivity Verification
• PadInspector
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Parametric TestingSemiconductor Parametric Analyzer
• FS-Pro • FS800
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Noise MeasurementLow Frequency Noise
• 9812DX • 9812E • 9812HF
AC Dynamic Noise
• 9812AC
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Integrated Testing
Electrical Parameter Testing Software
• LabExpress
