9812DX
Low Frequency Noise Measurement System
Low Frequency Noise
1/f Noise & RTN
High-Accuracy & Wide-Range
9812DX Advanced Low Frequency Noise Analyzer delivers high-accuracy and efficient noise power spectral density analysis and time-domain noise measurements for semiconductor research, advanced process optimization, modeling for design verification and circuit evaluation.
Full capabilities for flicker noise (1/f noise) and random telegraph noise (RTN or RTS) measurement and analysis
Accommodate a wide impedance measurement range to meet various requirements for new materials, new devices and integrated circuits under wide voltage and current operating conditions
Wafer-level high performance and wide bandwidth measurement, current noise resolution up to 10-27A²/Hz
Powerful data analysis and management capabilities with easy-to-use built-in test application library and intuitive graphical user interface
Used in conjunction with the Primarius semiconductor parameter testing system FS-Pro, providing a parallel testing framework solution that significantly improves testing efficiency and throughput
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SPICE Model
PDK
Standard Cell
Fabrication
Design Environment
Circuit Simulation
Circuit Simulation
Design & Verification
Parametric Testing
Noise Measurement
Integrated Testing
